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Quantitative analysis by x-ray diffraction.

Some photometric instruments used in x-ray diffraction and spectrographic methods of analysis

Routine quantitative analysis by x-ray diffraction

Platinum expansion values for thermal calibration of high-temperature x-ray diffraction cameras and diffractometers

Absorption corrections for intensity of X-rays scattered by weakly absorbing polytype-crystalline materials

X-ray diffraction and optical microscopic data on several important phases in the binary systems CaO-Al₂O₃, CaO-SiO₂, and Na₂O-Al₂O₃

Evaluation of methods for determining nahcolite and dawsonite in oil shales

High-temperature enthalpy and x-ray powder diffraction data for ZrI4

High-temperature enthalpy and x-ray powder diffraction data for aluminum sulfide (Al₂S₃)


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