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Platinum expansion values for thermal calibration of high-temperature x-ray diffraction cameras and diffractometers

Absorption corrections for intensity of X-rays scattered by weakly absorbing polytype-crystalline materials

X-ray diffraction and optical microscopic data on several important phases in the binary systems CaO-Al₂O₃, CaO-SiO₂, and Na₂O-Al₂O₃

Published Year

• 1960-1969 (3) *

Subject

• X-rays--Diffraction (3) *
• Aluminum oxide (1)
• Aluminum silicates (1)
• Cameras (1)
• Platinum (1)
• X-rays--Industrial applications (1)

Author

• Ampian, Sarkis G. (1)
• Campbell, William Joseph, (1)
• Ergun, Sabri, (1)
• Smith, Robert W. (1)
• Tiensuu, Victor H. (1)

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