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X-ray diffraction and optical microscopic data on several important phases in the binary systems CaO-Al₂O₃, CaO-SiO₂, and Na₂O-Al₂O₃

Evaluation of continuous recording X-ray ash meter

Published Year

• 1960-1969 (2) *

Subject

• X-rays--Industrial applications (2) *
• Aluminum oxide (1)
• Aluminum silicates (1)
• Bituminous coal (1)
• X-rays--Diffraction (1)

Author

• Ampian, Sarkis G. (1)
• Deurbrouck, A. W. (1)
• Hudy, John. (1)

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