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Composition depth profiles and the effects of annealing for ion-implated alloys

Characterization of thin films and solid surfaces using proton-induced X-ray emission

Published Year

• 1970-1979 (1)
• 1980-1989 (1)

Subject

• Alloys (1)
• Ion implantation (1)
• Metals--Surfaces (1)
• Proton-induced X-ray emission (1)
• Solids--Surfaces (1)
• Thin films--Effect of radiation on (1)

Author

• Campbell, Arthur B., (2) *
• Needham, P. B. (1)
• Sartwell, Bruce D. (1)
• Sartwell, Bruce D., (1)

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