Microelectronic test patterns: an overview

Author:	Buehler, Martin G.
Year:	1974
Document Type:	NSBA
Issuing Agency:	National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.]
SUDOC:	C 13.10:400-6
Series:	U.S. Department of Commerce National Bureau of Standards special publication ;
Report Number:	400-6
Subjects:	Integrated circuits--Testing
	Electronic apparatus and appliances--Testing
Links:	https://hdl.handle.net/2027/mdp.39015077586280
	400-6