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The range in metals and metal oxide systems of heavy ions in the energy range 60 to 400 kev

Computer program for plotting data points from a multichannel analyzer via a remote teletype

Characterization of thin films and solid surfaces using proton-induced X-ray emission

Characterization of alloys formed by ion implantation

Published Year

• 1970-1979 (2)
• 1980-1989 (2)

Subject

• Alloys (1)
• Ion implantation (1)
• Nuclear physics (1)
• Particles (Nuclear physics) (1)
• Proton-induced X-ray emission (1)
• Pulse height analyzers (1)
• Scattering (Physics) (1)
• Solids--Surfaces (1)
• Spectrum analysis--Data processing (1)
• Teletype (1)
• Thin films--Effect of radiation on (1)

Author

• Sartwell, Bruce D. (4) *
• Needham, P. B. (2)
• Campbell, A. B. (1) *
• Campbell, Arthur B., (1)
• Covino, B. S. , (1)
• Danforth, D. (1)
• Graham, Richard S., (1)
• Needham, P. B., (1) *

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